Research Article

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2018, 11(11): 5989–5996

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https://doi.org/10.1007/s12274-018-2113-x

Sub-micrometer-scale chemical analysis by nanosecondlaser-induced tip-enhanced ablation and ionization timeof-flight mass spectrometry

Xiaoping Li1, Zhisen Liang1, Shudi Zhang1, Tongtong Wang1, and Wei Hang1,2 (*)

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1 Department of Chemistry and the MOE Key Lab of Spectrochemical Analysis & Instrumentation, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
2 State Key Laboratory of Marine Environmental Science, Xiamen University, Xiamen 361005, China

Keywords: tip-enhanced near-field technique, time-of-flight mass spectrometer, nanosecond laser, sub-micrometer-scale spatial resolution
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ABSTRACT The tip-enhanced near-field technique has drawn great attention recently because it is a promising technique for nanoscale chemical analysis when combined with other spectroscopic methods. Furthermore, this integration can improve the spatial resolution of mass spectrometry. In this study, a nanosecond-laser (ns-laser)-induced tip-enhanced ablation and ionization source was coupled to an in-house-built laser ionization time-of-flight mass spectrometer. Sub-micrometer-sized craters (with diameters of 200–300 nm) were observed on titanium (Ti) film coated onto a gold (Au) substrate. The corresponding mass spectra were acquired, which verified that sub-micrometer-sized ablation (and subsequently ionization) could be achieved by the ns-laser-induced tip-enhanced electromagnetic field. In addition, formation of the crater was studied with an increased number of laser pulses. Furthermore, a mass spectrometry imaging (MSI) experiment was performed with potassium chloride (KCl) residue dropped onto nano-patterned gold pillars, achieving 80-nm lateral resolution.
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Sub-micrometer-scale chemical analysis by nanosecondlaser-induced tip-enhanced ablation and ionization timeof-flight mass spectrometry. Nano Res. 2018, 11(11): 5989–5996 https://doi.org/10.1007/s12274-018-2113-x

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