Research Article


2019, 12(4): 939–946


Analysis of structural distortion in Eshelby twisted InP nanowires by scanning precession electron diffraction

Daniel Ugarte1,2 (*), Luiz H. G. Tizei3, Monica A. Cotta1, Caterina Ducati2, Paul A. Midgley2, and Alexander S. Eggeman2,4 (*)

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1 Instituto de Física “Gleb Wataghin”, Universidade Estadual de Campinas-UNICAMP, CEP 13083-859, Campinas - SP, Brazil
2 Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK
3 Laboratoire de Physique des Solides, CNRS UMR8502, Univ. Paris Sud, 91405 Orsay, France
4 School of Materials, University of Manchester, Manchester, M13 9PL, UK

Keywords: electron microscopy, scanning precession electron diffraction, Eshelby twist, screw dislocation, nanowire, indium phosphide
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Transmission electron microscopes (TEM) are widely used in nanotechnology research. However, it is still challenging to characterize nanoscale objects; their small size coupled with dynamical diffraction makes interpreting real- or reciprocal-space data difficult. Scanning precession electron diffraction ((S)PED) represents an invaluable contribution, reducing the dynamical contributions to the diffraction pattern at high spatial resolution. Here a detailed analysis of wurtzite InP nanowires (30–40 nm in diameter) containing a screw dislocation and an associated wire lattice torsion is presented. It has been possible to characterize the dislocation with great detail (Burgers and line vector, handedness). Through careful measurement of the strain field and comparison with dynamical electron diffraction simulations, this was found to be compatible with a Burgers vector modulus equal to one hexagonal lattice cell parameter despite the observed crystal rotation rate being larger (ca. 20%) than that predicted by classical elastic theory for the nominal wire diameter. These findings corroborate the importance of the (S)PED technique for characterizing nanoscale materials.
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Analysis of structural distortion in Eshelby twisted InP nanowires by scanning precession electron diffraction. Nano Res. 2019, 12(4): 939–946

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